MEASURING APPARATUS AND ACCURACY CONTROL METHOD

To support the accuracy control of a measurement apparatus.SOLUTION: The measuring apparatus includes a measuring unit for measuring a control sample used for an accuracy control, a display unit, and a processing unit for displaying on the display unit an input screen to set evaluation criteria to b...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TATSUYA HIROMOTO, YONEDA SATOSHI, TSURUOKA YASUAKI, TSUJI TOMOHISA, KINISHI MOTOI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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