MEASURING APPARATUS AND ACCURACY CONTROL METHOD

To support the accuracy control of a measurement apparatus.SOLUTION: The measuring apparatus includes a measuring unit for measuring a control sample used for an accuracy control, a display unit, and a processing unit for displaying on the display unit an input screen to set evaluation criteria to b...

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Bibliographische Detailangaben
Hauptverfasser:	TATSUYA HIROMOTO, YONEDA SATOSHI, TSURUOKA YASUAKI, TSUJI TOMOHISA, KINISHI MOTOI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	To support the accuracy control of a measurement apparatus.SOLUTION: The measuring apparatus includes a measuring unit for measuring a control sample used for an accuracy control, a display unit, and a processing unit for displaying on the display unit an input screen to set evaluation criteria to be used in the accuracy control in which the processing unit displays an accuracy management result of the control sample on the display unit based on the measurement result of the control sample and the evaluation criteria, thereby solving the problem.SELECTED DRAWING: Figure 1 【課題】測定装置において精度管理を支援することを一課題とする。【解決手段】精度管理を行うための管理試料を測定する測定部と、表示部と、前記精度管理において使用される評価基準を設定するための入力画面を前記表示部に表示する処理部と、を備え、前記処理部は、前記管理試料の測定結果および前記評価基準に基づき、前記検査項目の精度管理結果を前記表示部に表示する、測定装置により解決する。【選択図】図１