PZT ELEMENT, AND PZT ELEMENT PRODUCTION METHOD

To provide a PZT element that does not have high breakdown voltage but has high durability.SOLUTION: A PZT element 5 is obtained by sputtering a ground layer 23 composed of an LaNiOthin film grown in a range of 485°C or more and 585°C or less with a sputtering target composed of PZT having Ni added...

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Bibliographische Detailangaben
Hauptverfasser: TSUYUKI TATSURO, KIMURA ISAO, JINBO TAKETO, KOBAYASHI HIROKI
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide a PZT element that does not have high breakdown voltage but has high durability.SOLUTION: A PZT element 5 is obtained by sputtering a ground layer 23 composed of an LaNiOthin film grown in a range of 485°C or more and 585°C or less with a sputtering target composed of PZT having Ni added thereto, and forming a PZT layer 24 containing Ni of 0.1 at% or more and 5 at% or less.SELECTED DRAWING: Figure 1 【課題】破壊電圧は高くないが、耐久性が高いPZT素子を提供する。【解決手段】485℃以上585℃以下の温度範囲の温度で成長させたLaNiO3薄膜から成る下地層23上に、Niが添加されたPZTから成るスパッタリングターゲットをスパッタリングし、Niが0.1at%以上5at%以下の範囲で含有されたPZT層24を形成することで得られる、PZT素子5。【選択図】図1