APPARATUS AND METHOD FOR MEASURING ENERGY SPECTRUM OF REFLECTED ELECTRON
To provide an apparatus capable of realizing high energy resolution in a wide energy region.SOLUTION: An apparatus includes: an electron beam source 101 that generates a primary electron beam; electron optical systems 102, 105, and 112 that guide the primary electron beam to a sample and focus and d...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng ; jpn |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | To provide an apparatus capable of realizing high energy resolution in a wide energy region.SOLUTION: An apparatus includes: an electron beam source 101 that generates a primary electron beam; electron optical systems 102, 105, and 112 that guide the primary electron beam to a sample and focus and deflect the primary electron beam; and an energy analysis system capable of detecting the energy spectrum of reflected electrons generated from the sample. The energy analysis system includes: a Wien filter 108 that disperses reflected electrons; a detector 107 that measures the energy spectrum of the reflected electrons dispersed by the Wien filter 108; and an operation control unit 150 that moves the detection position of the reflected electrons of the detector 107 in synchronization with a change in the intensity of the quadrupole field while changing the intensity of the quadrupole field of the Wien filter 108.SELECTED DRAWING: Figure 1
【課題】広いエネルギー領域において高エネルギー分解能を実現できる装置を提供する。【解決手段】装置は、1次電子線を発生させるための電子線源101と、1次電子線を試料まで導いて集束かつ偏向させる電子光学系102,105,112と、試料から発生した反射電子のエネルギースペクトルを検出可能なエネルギー分析系を備える。エネルギー分析系は、反射電子を分散させるウィーンフィルタ108と、ウィーンフィルタ108によって分散された反射電子のエネルギースペクトルを測定するための検出器107と、ウィーンフィルタ108の4極場の強度を変化させながら、4極場の強度の変化と同期して検出器107の反射電子の検出位置を移動させる動作制御部150とを備える。【選択図】図1 |
---|