INSPECTION DEVICE LEAD WIRE, LEAD WIRE MOUNTING COMPONENT AND INSPECTION JIG
To provide an inspection device lead wire or the like that can reduce abrasion of an end surface of the lead wire even if an end of the lead wire on a side of an inspection device installed at a narrow pitch on an inspection jig of a measurement object repeatedly contacts an end surface of an inspec...
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| Format: | Patent |
| Sprache: | eng ; jpn |
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| Zusammenfassung: | To provide an inspection device lead wire or the like that can reduce abrasion of an end surface of the lead wire even if an end of the lead wire on a side of an inspection device installed at a narrow pitch on an inspection jig of a measurement object repeatedly contacts an end surface of an inspection probe repeatedly.SOLUTION: An inspection device lead wire is configured so that a conductor portion 52 consists of copper alloy wire with a conductor diameter (diameter) in the range of 0.018 to 0.18 mm, a tensile strength in the range of 700 to 1,500 MPa, a micro Vickers hardness in the range of 200 to 350 HV (0.04), and conductivity in the range of 60 to 85% IACS, in the lead wire provided on an inspection jig 10 that constitutes an inspection device for a measurement object 11 and having the conductor portion 52 that repeatedly contacts a probe 1.SELECTED DRAWING: Figure 1
【課題】被測定体の検査用治具に狭ピッチで設置された検査装置側リード線の端部と、検査用のプローブの端面とが繰り返し接触した場合であっても、そのリード線の端面の摩耗を低減させることができる検査装置用リード線等を提供する。【解決手段】被測定体１１の検査装置を構成する検査用治具１０に設けられてプローブ１に繰り返し接触する導体部５２を有するリード線において、その導体部５２は、導体径（直径）が０．０１８〜０．１８ｍｍの範囲内の銅合金線からなり、引張強度が７００〜１５００ＭＰａの範囲内であり、マイクロビッカース硬度が２００〜３５０ＨＶ（０．０４）の範囲内であり、導電率が６０〜８５％ＩＡＣＳの範囲内であるように構成した検査装置用リード線により上記課題を解決した。【選択図】図１ |
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