APPEARANCE INSPECTION DEVICE

To provide an appearance inspection device that can inspect a high-reflection abnormal object and a low-reflection abnormal object on an inspection target object by one imaging.SOLUTION: The appearance inspection device is for detecting an abnormal target F of an inspection target object 1 from the...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	KOYAMA MASAMI, SUZUKI TOMOO, SATO KENJI, YASUNAGA KOJI, TOGASHI NORIHITO
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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