INSPECTION DEVICE AND INSPECTION PROGRAM

To provide an inspection device capable of testing a reporting system in a short time with less labor.SOLUTION: An inspection device according to the present embodiment inspects a monitoring device capable of outputting, as a report, a measurement value and a measurement time of a monitoring target...

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Bibliographische Detailangaben
Hauptverfasser: IDE KOSHIRO, MIMATSU YOHEI, TANAKA KAZUTO
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide an inspection device capable of testing a reporting system in a short time with less labor.SOLUTION: An inspection device according to the present embodiment inspects a monitoring device capable of outputting, as a report, a measurement value and a measurement time of a monitoring target in association with each other. A time-passage acceleration unit shortens a time point to 1/n(n>1) from an actual time point, and provide it to the monitoring device. A measurement value generation unit obtains or generates a measurement value for the monitor target and provides this measurement value to the monitoring device. A storage unit stores the measurement value and an input time point provided by the time-passage acceleration unit when this measurement value is input, such that they correspond to each other. An arithmetic unit compares the report generated by the monitoring device using the measurement value and the input time point, with the measurement value and the input time point stored in the storage unit, and determines whether the report is correct or wrong. A display unit displays a determination result of the arithmetic unit.SELECTED DRAWING: Figure 2 【課題】少ない労力で短時間に帳票システムを試験することができる検査装置を提供する。【解決手段】本実施形態による検査装置は、監視対象の測定値および測定時刻を関連付けて帳票として出力可能な監視装置を検査する。経時加速部は、時刻を実際よりも1/n(n>1)に短縮して監視装置に与える。測定値生成部は、監視対象の測定値を得てあるいは生成し、監視装置に該測定値を与える。記憶部は、測定値と該測定値を入力したときの経時加速部から与えられた入力時刻とを対応させて格納する。演算部は、測定値および入力時刻を用いて監視装置が生成した帳票を、記憶部に格納された測定値および入力時刻と比較し、帳票の正否を判断する。表示部は、演算部の判断結果を表示する。【選択図】図2