AUTOMATIC PART APPEARANCE INSPECTION DEVICE

To provide an automatic inspection device which is capable of acquiring clear images that enable quality assessment of entire appearance of small parts and image-processing the same to perform quality assessment, and which offers a superior cost performance ratio.SOLUTION: An automatic part appearan...

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Bibliographische Detailangaben
Hauptverfasser: MORITA YOSHINORI, KOMARUYAMA HIROKO, NANBU SHUTARO, YAMADA MASATOMO, SONE KENRO
Format: Patent
Sprache:eng ; jpn
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Beschreibung
Zusammenfassung:To provide an automatic inspection device which is capable of acquiring clear images that enable quality assessment of entire appearance of small parts and image-processing the same to perform quality assessment, and which offers a superior cost performance ratio.SOLUTION: An automatic part appearance inspection device is configured to acquire appearance images of inspection target parts and image-process the acquired appearance images to automatically assess the quality of the inspection target parts. The image processing comprises steps of pre-feeding a number of pieces of fine/faulty image data, performing a learning process by means of the deep learning technique, optimizing parameters to generate a learning binary file, and selecting defect items that are difficult to assess from a variety of defect items and using the learning binary file to perform image processing of the selected defect items.SELECTED DRAWING: Figure 10 【課題】小型部品の全外観の良否判別が可能な鮮明な画像を取得し、それを画像処理して良否判別を行うことが可能なコスト性能比に優れた自動検査装置を提供する。【解決手段】被検査部品の外観画像を取得し、所得した外観画像を画像処理することにより被検査部品の良否を自動判別する部品外観自動検査装置であって、画像処理において、事前に多数の良否画像データを与え、ディープラーニング技術により学習処理し、パラメータを最適化して学習バイナリファイルを作成し、様々な不良項目の内、良否判別の難しい不良項目の画像処理を学習バイナリファイルで行う。【選択図】図10