METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

To form a p-type semiconductor region by ion implantation into a gallium nitride (GaN)-based semiconductor.SOLUTION: A method for manufacturing a semiconductor device includes: a first groove formation step of forming a first groove with respect to a laminate including a gallium-nitride (GaN)-based...

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Hauptverfasser: NIWA SHIGEKI, FUJII TAKAHIRO, OZAKI MASAYOSHI
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To form a p-type semiconductor region by ion implantation into a gallium nitride (GaN)-based semiconductor.SOLUTION: A method for manufacturing a semiconductor device includes: a first groove formation step of forming a first groove with respect to a laminate including a gallium-nitride (GaN)-based first semiconductor layer containing n-type impurities and a gallium-nitride (GaN)-based second semiconductor layer laminated on the first semiconductor layer and containing p-type impurities, the first groove having a bottom located in the second semiconductor layer; a deposition step of depositing p-type impurities to a side and the bottom of the first groove; and an ion implantation step of performing ion implantation of p-type impurities to the first semiconductor layer via the first groove.SELECTED DRAWING: Figure 2 【課題】窒化ガリウム(GaN)系の半導体に、イオン注入によってp型半導体領域を形成する。【解決手段】半導体装置の製造方法は、n型不純物を含有する窒化ガリウム(GaN)系の第1半導体層と、第1半導体層に積層され、p型不純物を含有する窒化ガリウム(GaN)系の第2半導体層とを含む積層体に対し、第2半導体層内に底部が位置する第1溝部を形成する、第1溝部形成工程と、第1溝部の側部及び底部にp型不純物を堆積させる堆積工程と、第1溝部を介して、p型不純物を第1半導体層までイオン注入する、イオン注入工程と、を備える。【選択図】図2