SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
To provide a stacked CMOS where an upper-layer surrounding gate electrode acts as a lower-layer gate electrode.SOLUTION: A CMOS composed of stacked P-channel and N-channel MIS field effect transistors comprises: lower semiconductor layers (2, 12) provided on a semiconductor substrate 1; upper semico...
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Zusammenfassung: | To provide a stacked CMOS where an upper-layer surrounding gate electrode acts as a lower-layer gate electrode.SOLUTION: A CMOS composed of stacked P-channel and N-channel MIS field effect transistors comprises: lower semiconductor layers (2, 12) provided on a semiconductor substrate 1; upper semiconductor layers (9, 11, 13) provided on the lower semiconductor layers via an interlayer insulation film 7; a surrounding gate electrode 16 including a lower-layer gate electrode, which has a structure of surrounding all round a part 13 of the upper semiconductor layers via an upper-layer gate insulation film 15 and provided directly on a part 12 of the lower semiconductor layers via a lower-layer gate insulation film 14; and one conductivity type source-drain regions (5, 6) provided in a part 2 of the lower semiconductor layers and the opposite conductivity type source-drain regions (17-20) provided parts (9, 11) of the upper semiconductor layers, which have a structure with opposite ends forming perpendicular planes with respect to a principal surface of the semiconductor substrate in a self-aligned fashion with the surrounding gate electrode 16.SELECTED DRAWING: Figure 1
【課題】上層包囲型ゲート電極で、下層ゲート電極を代行した積層CMOSの提供【解決手段】半導体基板1上に下層半導体層(2、12)が設けられ、下層半導体層上に層間絶縁膜7を介して上層半導体層(9、11、13)が設けられ、上層半導体層の一部13の全周囲に上層ゲート絶縁膜15を介して包囲する構造の、下層ゲート電極を含む包囲型ゲート電極16が、下層半導体層の一部12直上に下層ゲート絶縁膜14を介して設けられ、包囲型ゲート電極16に自己整合して、対向する端部が半導体基板の主面に垂直平面をなす構造の、一導電型ソースドレイン領域(5、6)を下層半導体層の一部2に、反対導電型ソースドレイン領域(17〜20)を上層半導体層の一部(9、11)に設けた積層構造のPチャネル及びNチャネルのMIS電界効果トランジスタからなるCMOS。【選択図】図1 |
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