POSITION-MEASUREMENT DEVICE AND METHOD OF OPERATING THE SAME

To provide an improved solution for analyzing mechanical vibrations in the vicinity of a position measurement device.SOLUTION: A position measurement device comprises: a position sensor 20 capable of generating a position-dependent measurement signal M by scanning a measurement scale 14 of a scale c...

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Bibliographische Detailangaben
Hauptverfasser: SEBASTIAN LENZ, THOMAS GEISLER, JOHANNES SOIER, INGO JOACHIMSTHALER
Format: Patent
Sprache:eng ; jpn
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Beschreibung
Zusammenfassung:To provide an improved solution for analyzing mechanical vibrations in the vicinity of a position measurement device.SOLUTION: A position measurement device comprises: a position sensor 20 capable of generating a position-dependent measurement signal M by scanning a measurement scale 14 of a scale carrier 12; a processing unit 30 capable of processing the position-dependent measurement signal M into a position signal P; and an interface unit 40 for transmitting the position signal P to a subsequent electronic device 80 via a data transmission channel 44. The position-measurement device has a motion sensor 20 configured to generate time-varying measurement signal M which is fed to a signal analysis unit 50 capable of evaluating the measurement signal in the frequency domain. Parameters PAR on which the evaluation is dependent can be transmitted from the subsequent electronic device 80 to the interface unit 40, and result data ED obtained from the evaluation of the measurement signal can be transmitted from the interface unit 40 to the subsequent electronic device 80.SELECTED DRAWING: Figure 1 【課題】位置測定装置の周辺内の機械振動を分析するための改善された解決方法を提供する。【解決手段】位置測定装置は、目盛キャリヤ12の測定目盛14を走査して位置依存の測定信号Mを発生可能な位置センサ20、位置依存の測定信号Mを位置信号Pに処理可能な処理ユニット30、データ伝送チャネル44を介して後置電子装置80に位置信号Pを伝送するインタフェースユニット40を有し、時間的に変化する測定信号Mを発生する運動センサ20を備え、測定信号は周波数範囲内の測定信号を評価可能で信号分析ユニット50に供給され、評価が依存するパラメータPARは後置電子装置80からインタフェースユニット40に伝送可能で測定信号の評価から得た結果データEDはインタフェースユニット40から後置電子装置80に伝送可能である。【選択図】図1