SEMICONDUCTOR STORAGE DEVICE
To reduce writing time in a test mode.SOLUTION: A semiconductor storage device comprises a first memory cell array 11 having a first block BLK1 including a first memory cell MT and a second block BLK2 including a second memory cell MT, and a control part 15. The control part performs a first program...
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| Format: | Patent |
| Sprache: | eng ; jpn |
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| Zusammenfassung: | To reduce writing time in a test mode.SOLUTION: A semiconductor storage device comprises a first memory cell array 11 having a first block BLK1 including a first memory cell MT and a second block BLK2 including a second memory cell MT, and a control part 15. The control part performs a first program on the first memory cell and the second memory cell in a first period in writing.SELECTED DRAWING: Figure 6
【課題】テストモードにおける書き込み時間の短縮を図る。【解決手段】半導体記憶装置は、第１メモリセルＭＴを含む第１ブロックＢＬＫ１と、第２メモリセルＭＴを含む第２ブロックＢＬＫ２とを含む第１メモリセルアレイ１１と、制御部１５と、を具備する。前記制御部は、書き込みにおける第１期間において、前記第１メモリセルおよび前記第２メモリセルに第１プログラムを行う。【選択図】 図６ |
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