WORK SYSTEM AND WORKING METHOD OF WORK SYSTEM

To provide a work system and so on which can suitably perform a work for a work object by reducing influence given to a distance measuring unit under strict peripheral environment and by suppressing physical interference to peripheral environment even under unknown peripheral environment.SOLUTION: A...

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Bibliographische Detailangaben
Hauptverfasser: KIUCHI YUSUKE, HASHIMOTO TATSUYA
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide a work system and so on which can suitably perform a work for a work object by reducing influence given to a distance measuring unit under strict peripheral environment and by suppressing physical interference to peripheral environment even under unknown peripheral environment.SOLUTION: A work system 1 comprising: a first distance measuring sensor 11 which measures a distance of peripheral environment; a second distance measuring sensor 12 which measures a distance of a work object 8; a manipulator 10 which performs a work for the work object 8; a first shutter mechanism 17 which performs changeover the first distance measuring sensor 11 between a measurement state and a shield state; a second shutter mechanism 18 which performs changeover the second distance measuring sensor 12 between a measurement state and a shield state; and a control part 15 for controlling each part. The first distance measuring sensor 11 is rough in a measurement point with respect to the second distance measuring sensor 12 and is long in a measurement distance with respect to the second distance measuring sensor 12, and the second distance measuring sensor 12 is tight in a measurement point with respect to the first distance measuring sensor 11 and is short in a measurement distance with respect to the first distance measuring sensor 11.SELECTED DRAWING: Figure 1 【課題】厳しい周辺環境下において、測距部に与えられる影響を軽減すると共に、未知となる周辺環境下においても、周辺環境に対する物理的な干渉を抑制して、作業対象物に対し好適に作業できる作業システム等を提供する。【解決手段】周辺環境を測距する第1測距センサ11と、作業対象物8を測距する第2測距センサ12と、作業対象物8に作業を行うマニピュレータ10と、第1測距センサ11を計測状態と遮蔽状態とで切り替える第1シャッター機構17と、第2測距センサ12を計測状態と遮蔽状態とで切り替える第2シャッター機構18と、各部を制御する制御部15と、を備える作業システム1であって、第1測距センサ11は、第2測距センサ12に対して計測点が粗となり、第2測距センサ12に対して測定距離が長いものであり、第2測距センサ12は、第1測距センサ11に対して計測点が密となり、第1測距センサ11に対して測定距離が短いものである。【選択図】図1