METAL THIN PLATE INSPECTION DEVICE AND METHOD FOR INSPECTING METAL THIN PLATE

To provide an inspection device and a method for inspection that can significantly increase the accuracy of detecting a fine defect by a simple device structure and can suppress outflow of defective items.SOLUTION: The metal thin plate inspection device for inspecting a metal thin plate includes: an...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SENOO MANABU, YOSHIDA TOSHIAKI, MATSUOKA SHOJI, UEDA SEIJI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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