RADIATION MEASURING DEVICE

To provide an improved technique that can suppress degradation of measurement results associated with re-combination of ionized carriers in the measurement of radiation.SOLUTION: A semiconductor device 10 generates ionized carriers in response to radiation. A high-rate shaping circuit 40 obtains a crest value for high-rate processing by processing with a short time constant on a detection signal by the ionized carriers. A low-rate shaping circuit 50 obtains a crest value for low-rate processing by processing with a long time constant on a detection signal by the ionized carriers. A measurement processing unit 60 obtains the result of measuring the radiation on the basis of a detection signal in which the crest value for the high-rate processing and the crest value for the low-rate processing are substantially the same and the influence of electrons of the ionized carriers is dominant.SELECTED DRAWING: Figure 1 【課題】放射線の測定において電離キャリアの再結合に伴う測定結果の劣化を抑制する改良技術を提供する。【解決手段】半導体素子１０は、放射線を受けて電離キャリアを発生する。高速整形回路４０は、電離キャリアによる検出信号に対する短い時定数の処理により高速処理の波高値を得る。低速整形回路５０は、電離キャリアによる検出信号に対する長い時定数の処理により低速処理の波高値を得る。測定処理部６０は、高速処理の波高値と低速処理の波高値が互いに実質的に同等であり電離キャリアの電子の影響が支配的な検出信号に基づいて、放射線の測定結果を得る。【選択図】図１