SUBSTRATE PROCESSING DEVICE

PROBLEM TO BE SOLVED: To provide a substrate processing device which can suppress the deposition of a process liquid to the inside of a discharge port of a dry nozzle.SOLUTION: A substrate processing device according to an embodiment comprises a substrate holding part, a first nozzle, a second nozzl...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: SHINOHARA HIDETAKA, FUKUI SHOGO
Format: Patent
Sprache:eng ; jpn
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator SHINOHARA HIDETAKA
FUKUI SHOGO
description PROBLEM TO BE SOLVED: To provide a substrate processing device which can suppress the deposition of a process liquid to the inside of a discharge port of a dry nozzle.SOLUTION: A substrate processing device according to an embodiment comprises a substrate holding part, a first nozzle, a second nozzle and a control part. The substrate holding part serves to hold a substrate. The first nozzle discharges, toward the substrate, a fluid mixture of liquid and air or mist of the liquid. The second nozzle discharges a dry air toward the substrate. The control part performs a first process to discharge the mixture air or mist from the first nozzle located near the second nozzle toward the substrate, and it performs a second process to stop the discharge from the first nozzle and then, discharge the dry air from the second nozzle toward the substrate. During the first process, the dry air is discharged from the second nozzle at a flow rate smaller than that during the second process.SELECTED DRAWING: Figure 3 【課題】乾燥用ノズルの吐出口内に処理液が付着することを抑制する基板処理装置を提供する。【解決手段】実施形態に係る基板処理装置は、基板保持部と、第1ノズルと、第2ノズルと、制御部とを備える。基板保持部は、基板を保持する。第1ノズルは、基板に液体と気体とを混合した混合流体又は液体のミストを吐出する。第2ノズルは、基板に乾燥用気体を吐出する。制御部は、第2ノズルに近接した位置に配置された第1ノズルから混合気体又はミストを基板に吐出する第1処理を行い、第1ノズルからの吐出を停止した後に、第2ノズルから乾燥用気体を基板に吐出する第2処理を行い、第1処理の間、第2処理時よりも小さい流量の乾燥用気体を第2ノズルから吐出させる。【選択図】図3
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2018129476A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2018129476A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2018129476A3</originalsourceid><addsrcrecordid>eNrjZJAODnUKDglyDHFVCAjyd3YNDvb0c1dwcQ3zdHblYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBoYWhkaWJuZmjsZEKQIApmYhMA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SUBSTRATE PROCESSING DEVICE</title><source>esp@cenet</source><creator>SHINOHARA HIDETAKA ; FUKUI SHOGO</creator><creatorcontrib>SHINOHARA HIDETAKA ; FUKUI SHOGO</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a substrate processing device which can suppress the deposition of a process liquid to the inside of a discharge port of a dry nozzle.SOLUTION: A substrate processing device according to an embodiment comprises a substrate holding part, a first nozzle, a second nozzle and a control part. The substrate holding part serves to hold a substrate. The first nozzle discharges, toward the substrate, a fluid mixture of liquid and air or mist of the liquid. The second nozzle discharges a dry air toward the substrate. The control part performs a first process to discharge the mixture air or mist from the first nozzle located near the second nozzle toward the substrate, and it performs a second process to stop the discharge from the first nozzle and then, discharge the dry air from the second nozzle toward the substrate. During the first process, the dry air is discharged from the second nozzle at a flow rate smaller than that during the second process.SELECTED DRAWING: Figure 3 【課題】乾燥用ノズルの吐出口内に処理液が付着することを抑制する基板処理装置を提供する。【解決手段】実施形態に係る基板処理装置は、基板保持部と、第1ノズルと、第2ノズルと、制御部とを備える。基板保持部は、基板を保持する。第1ノズルは、基板に液体と気体とを混合した混合流体又は液体のミストを吐出する。第2ノズルは、基板に乾燥用気体を吐出する。制御部は、第2ノズルに近接した位置に配置された第1ノズルから混合気体又はミストを基板に吐出する第1処理を行い、第1ノズルからの吐出を停止した後に、第2ノズルから乾燥用気体を基板に吐出する第2処理を行い、第1処理の間、第2処理時よりも小さい流量の乾燥用気体を第2ノズルから吐出させる。【選択図】図3</description><language>eng ; jpn</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180816&amp;DB=EPODOC&amp;CC=JP&amp;NR=2018129476A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180816&amp;DB=EPODOC&amp;CC=JP&amp;NR=2018129476A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SHINOHARA HIDETAKA</creatorcontrib><creatorcontrib>FUKUI SHOGO</creatorcontrib><title>SUBSTRATE PROCESSING DEVICE</title><description>PROBLEM TO BE SOLVED: To provide a substrate processing device which can suppress the deposition of a process liquid to the inside of a discharge port of a dry nozzle.SOLUTION: A substrate processing device according to an embodiment comprises a substrate holding part, a first nozzle, a second nozzle and a control part. The substrate holding part serves to hold a substrate. The first nozzle discharges, toward the substrate, a fluid mixture of liquid and air or mist of the liquid. The second nozzle discharges a dry air toward the substrate. The control part performs a first process to discharge the mixture air or mist from the first nozzle located near the second nozzle toward the substrate, and it performs a second process to stop the discharge from the first nozzle and then, discharge the dry air from the second nozzle toward the substrate. During the first process, the dry air is discharged from the second nozzle at a flow rate smaller than that during the second process.SELECTED DRAWING: Figure 3 【課題】乾燥用ノズルの吐出口内に処理液が付着することを抑制する基板処理装置を提供する。【解決手段】実施形態に係る基板処理装置は、基板保持部と、第1ノズルと、第2ノズルと、制御部とを備える。基板保持部は、基板を保持する。第1ノズルは、基板に液体と気体とを混合した混合流体又は液体のミストを吐出する。第2ノズルは、基板に乾燥用気体を吐出する。制御部は、第2ノズルに近接した位置に配置された第1ノズルから混合気体又はミストを基板に吐出する第1処理を行い、第1ノズルからの吐出を停止した後に、第2ノズルから乾燥用気体を基板に吐出する第2処理を行い、第1処理の間、第2処理時よりも小さい流量の乾燥用気体を第2ノズルから吐出させる。【選択図】図3</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAODnUKDglyDHFVCAjyd3YNDvb0c1dwcQ3zdHblYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBoYWhkaWJuZmjsZEKQIApmYhMA</recordid><startdate>20180816</startdate><enddate>20180816</enddate><creator>SHINOHARA HIDETAKA</creator><creator>FUKUI SHOGO</creator><scope>EVB</scope></search><sort><creationdate>20180816</creationdate><title>SUBSTRATE PROCESSING DEVICE</title><author>SHINOHARA HIDETAKA ; FUKUI SHOGO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2018129476A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2018</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>SHINOHARA HIDETAKA</creatorcontrib><creatorcontrib>FUKUI SHOGO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SHINOHARA HIDETAKA</au><au>FUKUI SHOGO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SUBSTRATE PROCESSING DEVICE</title><date>2018-08-16</date><risdate>2018</risdate><abstract>PROBLEM TO BE SOLVED: To provide a substrate processing device which can suppress the deposition of a process liquid to the inside of a discharge port of a dry nozzle.SOLUTION: A substrate processing device according to an embodiment comprises a substrate holding part, a first nozzle, a second nozzle and a control part. The substrate holding part serves to hold a substrate. The first nozzle discharges, toward the substrate, a fluid mixture of liquid and air or mist of the liquid. The second nozzle discharges a dry air toward the substrate. The control part performs a first process to discharge the mixture air or mist from the first nozzle located near the second nozzle toward the substrate, and it performs a second process to stop the discharge from the first nozzle and then, discharge the dry air from the second nozzle toward the substrate. During the first process, the dry air is discharged from the second nozzle at a flow rate smaller than that during the second process.SELECTED DRAWING: Figure 3 【課題】乾燥用ノズルの吐出口内に処理液が付着することを抑制する基板処理装置を提供する。【解決手段】実施形態に係る基板処理装置は、基板保持部と、第1ノズルと、第2ノズルと、制御部とを備える。基板保持部は、基板を保持する。第1ノズルは、基板に液体と気体とを混合した混合流体又は液体のミストを吐出する。第2ノズルは、基板に乾燥用気体を吐出する。制御部は、第2ノズルに近接した位置に配置された第1ノズルから混合気体又はミストを基板に吐出する第1処理を行い、第1ノズルからの吐出を停止した後に、第2ノズルから乾燥用気体を基板に吐出する第2処理を行い、第1処理の間、第2処理時よりも小さい流量の乾燥用気体を第2ノズルから吐出させる。【選択図】図3</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; jpn
recordid cdi_epo_espacenet_JP2018129476A
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title SUBSTRATE PROCESSING DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T18%3A22%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SHINOHARA%20HIDETAKA&rft.date=2018-08-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2018129476A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true