X-RAY ANALYSIS CELL, X-RAY ANALYSIS CONTAINER, X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD

PROBLEM TO BE SOLVED: To provide an X-ray analysis technique that can be practically used by a more simple method such as being capable of performing X-ray analysis by on-the-spot measurement under the same atmosphere as an actual process while heating a sample at a high temperature of 800°C or high...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TOKUDA KAZUYA, TSUCHIKO SATORU, KAMIMURA SHIGEAKI, GOTO KENGO
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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