MEASURING ELEMENT STACK FOR MEASURING FORCE OR PRESSURE AND METHOD FOR PRODUCING SUCH TYPE OF MEASURING ELEMENT STACK
PROBLEM TO BE SOLVED: To provide a measuring element stack avoiding drawbacks, having high-temperature strength, and capable of withstanding application of high loads and pressure by improving a type of a measuring element stack consisting of a plurality of piezoelectric crystal elements for measuri...
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide a measuring element stack avoiding drawbacks, having high-temperature strength, and capable of withstanding application of high loads and pressure by improving a type of a measuring element stack consisting of a plurality of piezoelectric crystal elements for measuring force and pressure.SOLUTION: Respective leading electrodes 12 are classified by one electric insulation areas 20, into small end electrodes 18 adjacent to one of both surfaces 14 and 15, and large main electrodes 19. One of the main electrodes 19 of a crystal element 11 is adjacent to a first surface 14 of the crystal element and comes into contact with a first front-side electrode 16, while the other main electrode 19 is adjacent to a second surface 15 of the crystal element and comes into contact with a second front-side electrode 17, where the end electrodes 18 of the adjacent leading electrode 12 are located in immediate proximity to each other.SELECTED DRAWING: Figure 1
【課題】冒頭に述べたタイプの、複数の圧電結晶素子からなる、力又は圧力を測定するための測定素子スタックを改良し、上述した短所を回避し、高温強度を有するとともに、高い荷重及び圧力の印加に耐える測定素子スタックを実現可能とする。【解決手段】各導出電極12は一つの電気絶縁領域20によって、両表面14,15の一方に隣接する小さな端電極18と、大きな主電極19とに区分され、結晶素子11の主電極19の一方は結晶素子の第一表面14に隣接するとともに第一表側電極16と接触し、他方の主電極19は結晶素子の第二表面15に隣接するとともに第二表側電極17と接触し、隣の導出電極12の端電極18は互いに密接している。【選択図】図1 |
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