PATTERN FORMING METHOD AND PRODUCTION METHOD OF REPLICA MOLD

PROBLEM TO BE SOLVED: To provide a pattern forming method and a production method of a replica mold, by which a rugged pattern can be formed with high accuracy without inducing irregular film thickness in a reverse layer formed by a reverse process on a protrusion structure of a substrate.SOLUTION:...

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Bibliographische Detailangaben
Hauptverfasser: ITO KIMIO, HOGEN MORIHISA, ODA HIROKAZU, NAKAGAWA MASARU, OKAWA YASUO
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a pattern forming method and a production method of a replica mold, by which a rugged pattern can be formed with high accuracy without inducing irregular film thickness in a reverse layer formed by a reverse process on a protrusion structure of a substrate.SOLUTION: A substrate 20 is prepared, which has a base part 21 having a first surface 21A and a second surface 21B opposing to the first surface and a protrusion structure 22 protruding from the first surface 21A side. A resist layer 31 having a rugged pattern including a plurality of recesses and projections is formed on the protrusion structure 22. A reverse layer formation material is applied on the resist layer 31 to cover the rugged pattern to form a reverse layer 41. The reverse layer 41 is etched to expose peaks of projections while filling the recesses of the rugged pattern with the reverse layer 41. The resist layer 31 is etched by using the etched reverse layer 41 as a mask to form a reverse layer pattern 42 on the protrusion structure.SELECTED DRAWING: Figure 2 【課題】基板の凸構造部上に反転プロセスにより形成される反転層に膜厚ムラを生じさせることなく、高精度に凹凸パターンを形成することのできるパターン形成方法及びレプリカモールドの製造方法を提供する。【解決手段】第1面21A及びそれに対向する第2面21Bを有する基部21と、第1面21A側から突出する凸構造部22とを有する基板20を準備し、複数の凹部及び凸部を含む凹凸パターンを有するレジスト層31を凸構造部22上に形成し、凹凸パターンを被覆するようにレジスト層31上に反転層形成材料を塗布して反転層41を形成し、凹凸パターンの凹部に反転層41を埋設させた状態で、凸部の頂部を露出させるように反転層41をエッチングし、エッチングされた反転層41をマスクとしてレジスト層31をエッチングすることで、凸構造部上に反転層パターン42を形成する。【選択図】図2