PROBE CARD AND TEST APPARATUS INCLUDING THE SAME

PROBLEM TO BE SOLVED: To provide a probe card that allows an abrasion degree of a probe pin to be examined via an electrical test.SOLUTION: A probe card for testing an electrical characteristic of a device under test (DUT) including a plurality of semiconductor devices includes a substrate, a first...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KIM GYU-YEOL, KANG SIN HO
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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