WASTE DEPOSIT LAYER HEIGHT MEASURING DEVICE AND METHOD FOR WASTE GASIFICATION MELTING FURNACE, AND WASTE GASIFICATION MELTING APPARATUS AND METHOD

PROBLEM TO BE SOLVED: To provide a device and method for measuring the layer height of a furnace waste deposit layer without being affected by high-temperature corrosive gas or dust in the furnace, and also to provide a waste gasification melting apparatus capable of being operated according to the variation of the layer height and a method therefor.SOLUTION: Radiant infrared rays from a surface of a waste deposit layer are detected by an infrared detection device 11 at two positions separated from each other at the top of the furnace body to form a temperature distribution image including a plurality of sectioned images for an area corresponding to the surface of the waste deposit layer. An arithmetic device 12 performs, on the temperature distribution images formed by the infrared detection devices 11, specific-point selection to define sectioned images corresponding to specific points on the surface of the waste deposit, the arithmetic device performing this process for each of two temperature distribution images formed respectively at two positions. The arithmetic device calculates the layer height at the specific points by calculating the distance from the top of the furnace body to the specific points by a stereo imaging method, based on a positional relationship between the sectioned images corresponding to the specific points on each of the temperature distribution images and on a positional relationship between the two positions where the infrared detection device is mounted.SELECTED DRAWING: Figure 1 【課題】炉内の高温腐食性ガスやダストの影響を受けることなく、炉内廃棄物堆積層の層高を測定する装置及び方法、層高の変動に対応して操業できる廃棄物ガス化溶融装置及び方法を提供することを課題とする。【解決手段】炉本体の上部にて離間した二位置で赤外線検出装置１１により廃棄物堆積層表面からの放射赤外線を検出し、廃棄物堆積層表面に対応する領域について複数の区画画像から成る温度分布画像を形成し、演算装置１２で、赤外線検出装置１１により形成された温度分布画像上において廃棄物堆積層表面上の特定点に対応する区画画像を定める特定点選定を、二位置で形成された二つの温度分布画像についてそれぞれ行い、それぞれの温度分布画像における特定点に対応する区画画像の位置関係と、赤外線検出装置を設けた二位置の位置関係とに基づきステレオ画像法により、炉本体の上部から特定点までの距離を算出することで、特定点での層高を算出する。【選択図】図１