PLASMA SPECTROSCOPIC ANALYSIS METHOD AND PLASMA SPECTROSCOPY ANALYZER
PROBLEM TO BE SOLVED: To provide a plasma spectroscopic analysis method which has a high analysis sensitivity and does not make a wrong analysis of a sample less frequently.SOLUTION: The plasma spectroscopic analysis method according to the present invention includes: a voltage application step of a...
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Sprache: | eng ; jpn |
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide a plasma spectroscopic analysis method which has a high analysis sensitivity and does not make a wrong analysis of a sample less frequently.SOLUTION: The plasma spectroscopic analysis method according to the present invention includes: a voltage application step of applying a voltage to a pair of electrodes under the presence of a sample; an enriching step of enriching an analysis target in the sample near at least one of the electrodes by the voltage application; and a detection step of generating plasma by applying a voltage to the pair of electrodes and detecting light emission of the analysis target caused by the plasma. In at least some intervals of the enriching step when the voltage is being applied, a current between the pair of electrodes is constant.SELECTED DRAWING: Figure 2
【課題】分析感度が高く、且つ、例えば、試料分析時の分析誤差の発生が抑制されたプラズマ分光分析方法を提供する。【解決手段】本開示のプラズマ分光分析方法は、試料の存在下、一対の電極への電圧印加を行う電圧印加工程を含み、前記電圧印加により、少なくとも一方の電極の近傍に前記試料中の分析対象物を濃縮する濃縮工程、及び前記一対の電極への電圧印加によりプラズマを発生させ、前記プラズマにより生じた前記分析対象物の発光を検出する検出工程を含み、前記濃縮工程の少なくとも一部の期間における電圧印加時の一対の電極間の電流が一定である。【選択図】図2 |
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