PARTICLE DETECTION DEVICE AND INSPECTION METHOD THEREOF
PROBLEM TO BE SOLVED: To provide a particle detection device which allows inspection of an optical system including a flow cell to be performed easily.SOLUTION: A particle detection device includes: an inspection light source 30 for emitting inspection light; a flow cell 40 which is irradiated with...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; jpn |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | FURUYA MASA OBARA TASUKE |
| description | PROBLEM TO BE SOLVED: To provide a particle detection device which allows inspection of an optical system including a flow cell to be performed easily.SOLUTION: A particle detection device includes: an inspection light source 30 for emitting inspection light; a flow cell 40 which is irradiated with the inspection light, and which is filled with fluid; and an imaging unit 90 for imaging a shape of reaction light which is generated by the inspection light traversing the fluid in the flow cell 40 and which has a different wavelength from the inspection light. Here, the fluid is, for example, liquid. The reaction light is Raman scattering light or fluorescence.SELECTED DRAWING: Figure 1
【課題】フローセルを含む光学系の検査が容易な粒子検出装置を提供する。【解決手段】検査光を発する検査光源３０と、検査光を照射される、流体で満たされるフローセル４０と、フローセル４０内の流体を横切る検査光によって生じた、検査光とは波長が異なる反応光の形状を撮像する撮像装置９０と、を備える粒子検出装置。ここで、流体とは、例えば液体である。反応光は、ラマン散乱光又は蛍光である。【選択図】図１ |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2017207336A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2017207336A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2017207336A3</originalsourceid><addsrcrecordid>eNrjZDAPcAwK8XT2cVVwcQ1xdQ7x9PcDssI8nV0VHP1cFDz9ggOgor6uIR7-LgohHq5Brv5uPAysaYk5xam8UJqbQcnNNcTZQze1ID8-tbggMTk1L7Uk3ivAyMDQ3MjA3NjYzNGYKEUAgwEokA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PARTICLE DETECTION DEVICE AND INSPECTION METHOD THEREOF</title><source>esp@cenet</source><creator>FURUYA MASA ; OBARA TASUKE</creator><creatorcontrib>FURUYA MASA ; OBARA TASUKE</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a particle detection device which allows inspection of an optical system including a flow cell to be performed easily.SOLUTION: A particle detection device includes: an inspection light source 30 for emitting inspection light; a flow cell 40 which is irradiated with the inspection light, and which is filled with fluid; and an imaging unit 90 for imaging a shape of reaction light which is generated by the inspection light traversing the fluid in the flow cell 40 and which has a different wavelength from the inspection light. Here, the fluid is, for example, liquid. The reaction light is Raman scattering light or fluorescence.SELECTED DRAWING: Figure 1
【課題】フローセルを含む光学系の検査が容易な粒子検出装置を提供する。【解決手段】検査光を発する検査光源３０と、検査光を照射される、流体で満たされるフローセル４０と、フローセル４０内の流体を横切る検査光によって生じた、検査光とは波長が異なる反応光の形状を撮像する撮像装置９０と、を備える粒子検出装置。ここで、流体とは、例えば液体である。反応光は、ラマン散乱光又は蛍光である。【選択図】図１</description><language>eng ; jpn</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171124&DB=EPODOC&CC=JP&NR=2017207336A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171124&DB=EPODOC&CC=JP&NR=2017207336A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FURUYA MASA</creatorcontrib><creatorcontrib>OBARA TASUKE</creatorcontrib><title>PARTICLE DETECTION DEVICE AND INSPECTION METHOD THEREOF</title><description>PROBLEM TO BE SOLVED: To provide a particle detection device which allows inspection of an optical system including a flow cell to be performed easily.SOLUTION: A particle detection device includes: an inspection light source 30 for emitting inspection light; a flow cell 40 which is irradiated with the inspection light, and which is filled with fluid; and an imaging unit 90 for imaging a shape of reaction light which is generated by the inspection light traversing the fluid in the flow cell 40 and which has a different wavelength from the inspection light. Here, the fluid is, for example, liquid. The reaction light is Raman scattering light or fluorescence.SELECTED DRAWING: Figure 1
【課題】フローセルを含む光学系の検査が容易な粒子検出装置を提供する。【解決手段】検査光を発する検査光源３０と、検査光を照射される、流体で満たされるフローセル４０と、フローセル４０内の流体を横切る検査光によって生じた、検査光とは波長が異なる反応光の形状を撮像する撮像装置９０と、を備える粒子検出装置。ここで、流体とは、例えば液体である。反応光は、ラマン散乱光又は蛍光である。【選択図】図１</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAPcAwK8XT2cVVwcQ1xdQ7x9PcDssI8nV0VHP1cFDz9ggOgor6uIR7-LgohHq5Brv5uPAysaYk5xam8UJqbQcnNNcTZQze1ID8-tbggMTk1L7Uk3ivAyMDQ3MjA3NjYzNGYKEUAgwEokA</recordid><startdate>20171124</startdate><enddate>20171124</enddate><creator>FURUYA MASA</creator><creator>OBARA TASUKE</creator><scope>EVB</scope></search><sort><creationdate>20171124</creationdate><title>PARTICLE DETECTION DEVICE AND INSPECTION METHOD THEREOF</title><author>FURUYA MASA ; OBARA TASUKE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2017207336A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2017</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>FURUYA MASA</creatorcontrib><creatorcontrib>OBARA TASUKE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FURUYA MASA</au><au>OBARA TASUKE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PARTICLE DETECTION DEVICE AND INSPECTION METHOD THEREOF</title><date>2017-11-24</date><risdate>2017</risdate><abstract>PROBLEM TO BE SOLVED: To provide a particle detection device which allows inspection of an optical system including a flow cell to be performed easily.SOLUTION: A particle detection device includes: an inspection light source 30 for emitting inspection light; a flow cell 40 which is irradiated with the inspection light, and which is filled with fluid; and an imaging unit 90 for imaging a shape of reaction light which is generated by the inspection light traversing the fluid in the flow cell 40 and which has a different wavelength from the inspection light. Here, the fluid is, for example, liquid. The reaction light is Raman scattering light or fluorescence.SELECTED DRAWING: Figure 1
【課題】フローセルを含む光学系の検査が容易な粒子検出装置を提供する。【解決手段】検査光を発する検査光源３０と、検査光を照射される、流体で満たされるフローセル４０と、フローセル４０内の流体を横切る検査光によって生じた、検査光とは波長が異なる反応光の形状を撮像する撮像装置９０と、を備える粒子検出装置。ここで、流体とは、例えば液体である。反応光は、ラマン散乱光又は蛍光である。【選択図】図１</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; jpn |
| recordid | cdi_epo_espacenet_JP2017207336A |
| source | esp@cenet |
| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | PARTICLE DETECTION DEVICE AND INSPECTION METHOD THEREOF |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T22%3A00%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=FURUYA%20MASA&rft.date=2017-11-24&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2017207336A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |