INSPECTION DEVICE, RECORDING MEDIUM AND PROGRAM

PROBLEM TO BE SOLVED: To provide an inspection device with which the time needed for inspecting the presence of a surface defect in an inspection object is short.SOLUTION: An inspection device 1 comprises: an irradiation unit 10 for causing a prescribed position in a display screen 11 to emit light and irradiating an inspection object 2 with light; a captured image acquisition unit 20 for acquiring a captured image 21 in which the inspection object 2 irradiated with light is imaged; a calculation unit 30 for calculating coordinates in the display screen 11 that correspond to coordinates in the captured image 21 on the basis of light-emitted position coordinate information indicating coordinates of the emitted position of light on the display screen 11 and light-received position coordinate information indicating coordinates of the received position of light in the captured image 21; and an inspection pattern fabrication 40 for fabricating, on the basis of the calculation result of the calculation unit 30, an inspection pattern for inspecting a surface defect of the inspection object 2, which is displayed on the display screen 11 so that a first pattern F consisting of prescribed brightness or higher in the captured image 21 and a second pattern S darker than the brightness of the first pattern F are alternately arranged in a row.SELECTED DRAWING: Figure 1 【課題】検査対象物の表面の欠陥の有無の検査に要する時間が短い検査装置を提供する。【解決手段】検査装置１は、表示画面１１内の所定の位置を発光させて検査対象物２に光を照射する照射部１０と、光が照射された検査対象物２を撮像した撮像画像２１を取得する撮像画像取得部２０と、表示画面１１における光の発光位置の座標を示す発光位置座標情報と、撮像画像２１における光の受光位置の座標を示す受光位置座標情報とに基づいて、撮像画像２１における座標に対応する表示画面１１における座標を算定する算定部３０と、算定部３０の算定結果に基づいて、撮像画像２１において所定以上の明度からなる第１パターンＦと第１パターンＦの明度よりも暗い第２パターンＳとが交互に並ぶように表示画面１１に表示され、検査対象物２の表面の欠陥を検査する検査パターンを作製する検査パターン作製部４０と、を備える。【選択図】図１