CIRCUIT DEVICE AND ELECTRONIC APPARATUS

PROBLEM TO BE SOLVED: To provide a circuit device capable of reducing effect on a circuit operation due to fluctuations of substrate potential, and to provide an electronic apparatus and the like.SOLUTION: A circuit device includes: a first circuit which comprises a transistor with a DMOS structure...

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Bibliographische Detailangaben
Hauptverfasser: YAMADA ATSUSHI, MORIYA ISAMU
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a circuit device capable of reducing effect on a circuit operation due to fluctuations of substrate potential, and to provide an electronic apparatus and the like.SOLUTION: A circuit device includes: a first circuit which comprises a transistor with a DMOS structure formed on a first N-type buried layer 51 on a P-type substrate 41; and a second circuit which comprises a transistor with a CMOS structure formed on a second N-type buried layer 52 separated from the first N-type buried layer 51.SELECTED DRAWING: Figure 2 【課題】基板電位の変動による回路動作への影響を低減できる回路装置及び電子機器等を提供すること。【解決手段】回路装置は、P型基板41上の第1のN型埋め込み層51上に形成されるDMOS構造のトランジスターにより構成される第1の回路と、第1のN型埋め込み層51と分離された第2のN型埋め込み層52上に形成されるCMOS構造のトランジスターにより構成される第2の回路と、を含む。【選択図】 図2