RESISTIVE MEMORY AND METHOD FOR MANUFACTURING THE SAME

PROBLEM TO BE SOLVED: To provide a resistive memory capable of preventing unsuccessful resetting by protecting a sidewall of a memory cell and further improving high-temperature data retention (HTDR), and a method for manufacturing the same.SOLUTION: A resistive memory 100 includes a first electrode...

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Bibliographische Detailangaben
Hauptverfasser: SHEN TING-YING, HO CHIA-HUA, HSU PO-YEN, CHIN TATSU, FU CHIHNG
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a resistive memory capable of preventing unsuccessful resetting by protecting a sidewall of a memory cell and further improving high-temperature data retention (HTDR), and a method for manufacturing the same.SOLUTION: A resistive memory 100 includes a first electrode 106a, a second electrode 118a, a variable resistance layer 108a, an oxygen exchange layer 114a, and a protective layer 112a. The first electrode and second electrode are arranged so as to face each other. The variable resistance layer is arranged between the first electrode and the second electrode. The oxygen exchange layer is arranged between the variable resistance layer and the second electrode. The protective layer is arranged on at least a sidewall of the oxygen exchange layer.SELECTED DRAWING: Figure 1-5 【課題】メモリセルの側壁を保護して、リセット失敗を防ぎ、高温データ保護(HTDR)をさらに高めることのできる抵抗性メモリおよびその製造方法を提供する。【解決手段】抵抗性メモリ100は、第1電極106a、第2電極118a、可変抵抗層108a、酸素交換層114a、および保護層112aを含む。第1電極および第2電極は、互いに対向して配置される。可変抵抗層は、第1電極と第2電極の間に配置される。酸素交換層は、可変抵抗層と第2電極の間に配置される。保護層は、酸素交換層の少なくとも側壁に配置される。【選択図】図1-5