STANDING WAVE INTERFEROMETRIC MICROSCOPE
PROBLEM TO BE SOLVED: To provide a wide visual field interferometric microscope and a usage thereof.SOLUTION: A wide visual field interferometric microscope includes: a specimen holder for holding a specimen at an analysis location; an illuminator for illuminating the specimen with input radiation,...
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| creator | XAVER VOEGELE RAINER DAUM |
| description | PROBLEM TO BE SOLVED: To provide a wide visual field interferometric microscope and a usage thereof.SOLUTION: A wide visual field interferometric microscope includes: a specimen holder for holding a specimen at an analysis location; an illuminator for illuminating the specimen with input radiation, so as to cause it to emit fluorescence light; a pair of projection systems arranged at opposite sides of the analysis location, to collect at least a portion of the fluorescence light and direct a corresponding pair of light beams into a respective pair of inputs of an optical combining element, at which the light beams optically interfere; and a detector arrangement for examining output light from the optical combining element. The illuminator is configured to produce a standing wave of input radiation at the analysis location. The detector arrangement includes strictly two interference detection branches.SELECTED DRAWING: Figure 3
【課題】広視野干渉顕微鏡及びその使用方法を提供する。【解決手段】広視野干渉顕微鏡は、解析位置で標本を保持する標本ホルダと、入力放射線を標本に照射して該標本に蛍光を放たせる照明器と、解析位置の両側に配置され、蛍光の少なくとも一部分を集め、対応する一対の光ビームを光結合要素の夫々の入力対に方向付け、光結合要素で光ビームが光学的に干渉するようにする一対の投射システムと、光結合要素からの出力光を試験する検出器配置とを有する。照明器は、解析位置で入力放射線の定在波を生じさせるよう構成される。検出器配置は、厳密に２つの干渉検出ブランチを有する。【選択図】図３ |
| format | Patent |
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【課題】広視野干渉顕微鏡及びその使用方法を提供する。【解決手段】広視野干渉顕微鏡は、解析位置で標本を保持する標本ホルダと、入力放射線を標本に照射して該標本に蛍光を放たせる照明器と、解析位置の両側に配置され、蛍光の少なくとも一部分を集め、対応する一対の光ビームを光結合要素の夫々の入力対に方向付け、光結合要素で光ビームが光学的に干渉するようにする一対の投射システムと、光結合要素からの出力光を試験する検出器配置とを有する。照明器は、解析位置で入力放射線の定在波を生じさせるよう構成される。検出器配置は、厳密に２つの干渉検出ブランチを有する。【選択図】図３</description><language>eng ; jpn</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170427&DB=EPODOC&CC=JP&NR=2017078855A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170427&DB=EPODOC&CC=JP&NR=2017078855A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XAVER VOEGELE</creatorcontrib><creatorcontrib>RAINER DAUM</creatorcontrib><title>STANDING WAVE INTERFEROMETRIC MICROSCOPE</title><description>PROBLEM TO BE SOLVED: To provide a wide visual field interferometric microscope and a usage thereof.SOLUTION: A wide visual field interferometric microscope includes: a specimen holder for holding a specimen at an analysis location; an illuminator for illuminating the specimen with input radiation, so as to cause it to emit fluorescence light; a pair of projection systems arranged at opposite sides of the analysis location, to collect at least a portion of the fluorescence light and direct a corresponding pair of light beams into a respective pair of inputs of an optical combining element, at which the light beams optically interfere; and a detector arrangement for examining output light from the optical combining element. The illuminator is configured to produce a standing wave of input radiation at the analysis location. The detector arrangement includes strictly two interference detection branches.SELECTED DRAWING: Figure 3
【課題】広視野干渉顕微鏡及びその使用方法を提供する。【解決手段】広視野干渉顕微鏡は、解析位置で標本を保持する標本ホルダと、入力放射線を標本に照射して該標本に蛍光を放たせる照明器と、解析位置の両側に配置され、蛍光の少なくとも一部分を集め、対応する一対の光ビームを光結合要素の夫々の入力対に方向付け、光結合要素で光ビームが光学的に干渉するようにする一対の投射システムと、光結合要素からの出力光を試験する検出器配置とを有する。照明器は、解析位置で入力放射線の定在波を生じさせるよう構成される。検出器配置は、厳密に２つの干渉検出ブランチを有する。【選択図】図３</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAIDnH0c_H0c1cIdwxzVfD0C3ENcnMN8vd1DQnydFbw9XQO8g929g9w5WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgaG5gbmFhampo7GRCkCAHFcJOo</recordid><startdate>20170427</startdate><enddate>20170427</enddate><creator>XAVER VOEGELE</creator><creator>RAINER DAUM</creator><scope>EVB</scope></search><sort><creationdate>20170427</creationdate><title>STANDING WAVE INTERFEROMETRIC MICROSCOPE</title><author>XAVER VOEGELE ; RAINER DAUM</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2017078855A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2017</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>XAVER VOEGELE</creatorcontrib><creatorcontrib>RAINER DAUM</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>XAVER VOEGELE</au><au>RAINER DAUM</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>STANDING WAVE INTERFEROMETRIC MICROSCOPE</title><date>2017-04-27</date><risdate>2017</risdate><abstract>PROBLEM TO BE SOLVED: To provide a wide visual field interferometric microscope and a usage thereof.SOLUTION: A wide visual field interferometric microscope includes: a specimen holder for holding a specimen at an analysis location; an illuminator for illuminating the specimen with input radiation, so as to cause it to emit fluorescence light; a pair of projection systems arranged at opposite sides of the analysis location, to collect at least a portion of the fluorescence light and direct a corresponding pair of light beams into a respective pair of inputs of an optical combining element, at which the light beams optically interfere; and a detector arrangement for examining output light from the optical combining element. The illuminator is configured to produce a standing wave of input radiation at the analysis location. The detector arrangement includes strictly two interference detection branches.SELECTED DRAWING: Figure 3
【課題】広視野干渉顕微鏡及びその使用方法を提供する。【解決手段】広視野干渉顕微鏡は、解析位置で標本を保持する標本ホルダと、入力放射線を標本に照射して該標本に蛍光を放たせる照明器と、解析位置の両側に配置され、蛍光の少なくとも一部分を集め、対応する一対の光ビームを光結合要素の夫々の入力対に方向付け、光結合要素で光ビームが光学的に干渉するようにする一対の投射システムと、光結合要素からの出力光を試験する検出器配置とを有する。照明器は、解析位置で入力放射線の定在波を生じさせるよう構成される。検出器配置は、厳密に２つの干渉検出ブランチを有する。【選択図】図３</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING |
| title | STANDING WAVE INTERFEROMETRIC MICROSCOPE |
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