STANDING WAVE INTERFEROMETRIC MICROSCOPE
PROBLEM TO BE SOLVED: To provide a wide visual field interferometric microscope and a usage thereof.SOLUTION: A wide visual field interferometric microscope includes: a specimen holder for holding a specimen at an analysis location; an illuminator for illuminating the specimen with input radiation,...
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide a wide visual field interferometric microscope and a usage thereof.SOLUTION: A wide visual field interferometric microscope includes: a specimen holder for holding a specimen at an analysis location; an illuminator for illuminating the specimen with input radiation, so as to cause it to emit fluorescence light; a pair of projection systems arranged at opposite sides of the analysis location, to collect at least a portion of the fluorescence light and direct a corresponding pair of light beams into a respective pair of inputs of an optical combining element, at which the light beams optically interfere; and a detector arrangement for examining output light from the optical combining element. The illuminator is configured to produce a standing wave of input radiation at the analysis location. The detector arrangement includes strictly two interference detection branches.SELECTED DRAWING: Figure 3
【課題】広視野干渉顕微鏡及びその使用方法を提供する。【解決手段】広視野干渉顕微鏡は、解析位置で標本を保持する標本ホルダと、入力放射線を標本に照射して該標本に蛍光を放たせる照明器と、解析位置の両側に配置され、蛍光の少なくとも一部分を集め、対応する一対の光ビームを光結合要素の夫々の入力対に方向付け、光結合要素で光ビームが光学的に干渉するようにする一対の投射システムと、光結合要素からの出力光を試験する検出器配置とを有する。照明器は、解析位置で入力放射線の定在波を生じさせるよう構成される。検出器配置は、厳密に2つの干渉検出ブランチを有する。【選択図】図3 |
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