SEM IMAGE ACQUISITION DEVICE AND SEM IMAGE ACQUISITION METHOD
PURPOSE: To provide a SEM image acquisition device and a SEM image acquisition method for acquiring and combining images by scanning an electron beam in a pixel corresponding manner when acquiring images in different scan directions, and for acquiring and combining images of pixel signals from the s...
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Format: | Patent |
Sprache: | eng ; jpn |
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Zusammenfassung: | PURPOSE: To provide a SEM image acquisition device and a SEM image acquisition method for acquiring and combining images by scanning an electron beam in a pixel corresponding manner when acquiring images in different scan directions, and for acquiring and combining images of pixel signals from the same position on a mask.CONSTITUTION: The SEM image acquisition device comprises: scan signal generation means for rotating a scanning direction of an electron beam that scans a surface of a specimen, and generating a scan signal that radiates a position on the specimen corresponding to the same region and the same pixel on the specimen; a deflection device which radiates the electron beam based on the generated scan signal; detection/amplification means for detecting/amplifying a signal from a position on the specimen irradiated with the electron beam; and image generation means for generating an image in the case where the position on the specimen corresponding to the same region and the same pixel on the specimen is irradiated, based on the detected/amplified signal.SELECTED DRAWING: Figure 1
【目的】本発明は、SEM画像取得装置およびSEM画像取得方法に関し、異なるスキャン方向の画像を取得する場合に、画素対応で電子ビームを走査して画像を取得して合成し、マスク上の同一位置からの画素信号の画像を取得して合成を実現することを目的とする。【構成】試料上を走査する電子ビームの走査方向を回転させ、試料上の同一領域かつ同一画素に対応した試料上の位置に照射する走査信号を発生する走査信号発生手段と、発生させた走査信号をもとに電子ビームを照射する偏向装置と、電子ビームを照射した試料上の位置からの信号を検出・増幅する検出・増幅手段と、検出・増幅した信号をもとに、試料上の同一領域かつ同一画素に対応した試料上の位置を照射したときの画像を生成する画像生成手段とを備える。【選択図】 図1 |
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