ANALYSIS OF STRUCTURE MODELED WITH INCONSISTENCIES MAPPED THEREON

PROBLEM TO BE SOLVED: To provide an apparatus and method for analyzing a structure modeled with inconsistencies mapped thereon.SOLUTION: A method for analyzing a structure includes processing nondestructive inspection (NDI) data 112 for a multi-layer structure to define areas of inconsistency at an...

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Hauptverfasser: KELLY M GREENE, JOHN G LIN, KELLER RUSSELL LEE, CARLYN R BREWER, HONG HUE-TAT
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide an apparatus and method for analyzing a structure modeled with inconsistencies mapped thereon.SOLUTION: A method for analyzing a structure includes processing nondestructive inspection (NDI) data 112 for a multi-layer structure to define areas of inconsistency at an internal layer or an interface between adjacent layers. The method includes mapping the areas of inconsistency to finite elements of a finite element model 114 of a nominal of the structure. The finite elements specified by mapping include finite elements for the affected internal layer or interface. The method includes producing a reconstructed finite element model 116 of the affected structure from the nominal finite element model 114, and a modified property or state value assigned to respective element datasets of the affected finite elements. The method includes performing a finite element method (FEM) failure analysis 110 of the reconstructed finite element model 116 under a load, which indicates an extent of residual integrity of the affected structure.SELECTED DRAWING: Figure 1 【課題】欠陥をマッピングしてモデル化した構造体を解析する装置及び方法を提供する。【解決手段】多層構造体の非破壊検査(NDI)データ112を処理して、内部層における欠陥領域又は隣接する層の間の界面における欠陥領域を規定する。前記欠陥領域を、前記構造体の公称の有限要素モデル114の有限要素にマッピングする。マッピングにより、特定された欠陥有限要素は、欠陥のある内部層又は界面の有限要素を含む。前記公称の有限要素モデル114及び前記欠陥有限要素のそれぞれの要素データセットに割り当てられた修正特性値又は修正状態値から、前記被疑構造体の再構築有限要素モデル116を作成する。続いて、負荷を加えた状態において、再構築有限要素モデル116の有限要素法(FEM)不良解析110を実行して、前記被疑構造体の残留完全性の程度を示すことを行う。【選択図】図1