PROXIMITY EXPOSURE APPARATUS AND PROXIMITY EXPOSURE METHOD
PROBLEM TO BE SOLVED: To provide a proximity exposure apparatus capable of achieving fine patterning.SOLUTION: A light irradiation apparatus 100 is a proximity exposure apparatus that exposes a workpiece W via a mask M by disposing the mask M having a prescribed pattern formed thereon and the workpi...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng ; jpn |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | PROBLEM TO BE SOLVED: To provide a proximity exposure apparatus capable of achieving fine patterning.SOLUTION: A light irradiation apparatus 100 is a proximity exposure apparatus that exposes a workpiece W via a mask M by disposing the mask M having a prescribed pattern formed thereon and the workpiece W with a prescribed gap provided therebetween. The light irradiation apparatus 100 includes a vacuum ultraviolet light source device 10 that irradiates parallel light including vacuum ultraviolet light as exposure light. The light irradiation apparatus 100 supplies a processing gas containing oxygen to a space connecting the gap between the mask M held to a mask stage 22 and the workpiece W held to a work stage 23 and, prior to execution of exposure processing, changes a distance between the mask M and the workpiece W to a second distance that is greater than a first distance at the time of exposure.SELECTED DRAWING: Figure 1
【課題】良好なパターニングを実現することができるプロキシミティ露光装置を提供する。【解決手段】光照射装置100は、所定のパターンが形成されたマスクMとワークWとを所定の間隙を設けて配置し、マスクMを介してワークWを露光するプロキシミティ露光装置である。光照射装置100は、露光光として真空紫外光を含む平行光を放射する真空紫外光光源装置10を備える。光照射装置100は、マスクステージ22に保持されたマスクMとワークステージ23に保持されたワークWとの間隙に連通する空間に、酸素を含む処理気体を供給し、露光処理に先立って、マスクMとワークWとの距離を、露光時における第一の距離よりも大きい第二の距離に切り替える。【選択図】 図1 |
---|