THREE-DIMENSIONAL INFORMATION ACQUISITION APPARATUS AND THREE-DIMENSIONAL INFORMATION ACQUISITION METHOD

PROBLEM TO BE SOLVED: To provide a technique for quickly acquiring high-accuracy three-dimensional information.SOLUTION: A three-dimensional information acquisition apparatus 100 comprises: an illumination optical system 11 illuminating a sample S through an optical sheet LL; an imaging device (imag...

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1. Verfasser: ISHIWATARI YUTAKA
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a technique for quickly acquiring high-accuracy three-dimensional information.SOLUTION: A three-dimensional information acquisition apparatus 100 comprises: an illumination optical system 11 illuminating a sample S through an optical sheet LL; an imaging device (imaging device 14a, imaging device 14b) including a two-dimensional imaging element and imaging the sample S illuminated by the illumination optical system 11; an observation optical system (observation optical system 13a, observation optical system 13b) forming a plurality of optical images of the sample S observed from a plurality of different directions on the two-dimensional imaging element; and a computer 18 calculating three-dimensional information of a plurality of pieces of image data of the sample S generated by the imaging device. D≤8*PP/β/NA is satisfied when PP>λ*β/(4*NA) is satisfied, where D represents the depth of the optical sheet LL, PP represents the pixel size of the imaging element, λ represents the wavelength of observation light from the sample S, β represents a magnification of optical image formed on the imaging element by the observation optical system, and NA represents the numerical aperture of the observation optical system on the object side.SELECTED DRAWING: Figure 7 【課題】高精度の3次元情報を高速に取得する技術を提供する。【解決手段】3次元情報取得装置100は、光シートLLで試料Sを照明する照明光学系11と、2次元撮像素子を有し照明光学系11に照明された試料Sを撮像する撮像装置(撮像装置14a、撮像装置14b)と、複数の異なる方向から観察した試料Sの複数の光学像を2次元撮像素子上に形成する観察光学系(観察光学系13a、観察光学系13b)と、撮像装置で生成された試料Sの複数の画像データから試料の3次元情報を算出するコンピュータ18を備える。光シートLLの厚さDは、PPを撮像素子の画素サイズ、λを試料Sからの観察光の波長、βを観察光学系によって撮像素子上に形成される光学像の倍率、NAを観察光学系の物体側の開口数とし、PP>λ・β/(4・NA)を満たすとき以下を満たす。D ≦ 8・PP/β/NA【選択図】図7