PHOTOCONDUCTIVE ELEMENT AND MEASUREMENT DEVICE

PROBLEM TO BE SOLVED: To provide: a photoconductive element capable of suitably adjusting an irradiation position of a laser beam and also capable of suppressing deterioration in an S/N ratio; and a measurement device.SOLUTION: A photoconductive element (110) includes a substrate (111), a photocondu...

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1. Verfasser: KAMO YOSHIHIKO
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide: a photoconductive element capable of suitably adjusting an irradiation position of a laser beam and also capable of suppressing deterioration in an S/N ratio; and a measurement device.SOLUTION: A photoconductive element (110) includes a substrate (111), a photoconductive layer (112) and a pair of electrode layers (113a, 113b). The pair of electrode layers form a gap portion (114). The photoconductive layer is formed on a first surface portion (111a-1, 111a-2, 111b-1, 111b-2, 111c) of the surface of the substrate, the first surface portion being located on the lower side of the pair of electrode layers and the gap portion, while is not formed on a second surface portion (111d) of the surface of the substrate.SELECTED DRAWING: Figure 3 【課題】レーザ光の照射位置を好適に調整可能であると共にS/N比の悪化を抑制可能な光伝導素子及び計測装置を提供する。【解決手段】光伝導素子(110)は、基板(111)と、光伝導層(112)と、一対の電極層(113a、113b)とを備え、一対の電極層はギャップ部(114)を形成し、光伝導層は、基板の表面のうち一対の電極層及びギャップ部の下側に位置する第1面部分(111a−1、111a−2、111b−1、111b−2、111c)上に形成されている一方で、基板の表面のうち第2面部分(111d)上には形成されていない。【選択図】図3