NICKEL PARTICLE AND METHOD FOR PRODUCING THE SAME
PROBLEM TO BE SOLVED: To provide nickel particles having excellent dispersibility which is obtained by a liquid phase method.SOLUTION: There are provided nickel particles produced by a liquid phase method in which the ratio between a crystal peak of nickel carbide and a crystal peak of nickel in the...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | eng ; jpn |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | PROBLEM TO BE SOLVED: To provide nickel particles having excellent dispersibility which is obtained by a liquid phase method.SOLUTION: There are provided nickel particles produced by a liquid phase method in which the ratio between a crystal peak of nickel carbide and a crystal peak of nickel in the XRD measurement is 5% or less and the calculated value calculated by the following expression is 50 or less. V=A/S/D/10000000(1) {wherein, A means the detection amount [ppm] of nickel dimethylglyoxime detected by the measurement method of nickel specified in JIS K 0102 59.1, S means the specific surface area [m/g] of nickel particles measured by a gas absorption method and D means the average particle diameter of nickel particles measured by a scanning electron microscope (SEM)}.SELECTED DRAWING: None
【課題】液相法によって得られ、優れた分散性を有するニッケル粒子を提供する。【解決手段】ニッケル粒子は、液相法で製造され、XRD測定における炭化ニッケルの結晶ピークとニッケルの結晶ピークの比率が5%以下であり、下記の式(1)で計算される計算値Vが50以下である。V=A/S/D3/10000000 ... ...(1){式中、AはJIS K 0102 59.1に規定するニッケルの測定法で検出されるニッケルジメチルグリオキシムの検出量[ppm]を意味し、Sはガス吸着法で測定されるニッケル粒子の比表面積[m2/g]を意味し、Dは走査型電子顕微鏡(SEM)で測定されるニッケル粒子の平均粒子径[nm]を意味する。}【選択図】なし |
---|