DEVICE AND METHOD FOR ANALYZING ABRASIVE LAYER

PROBLEM TO BE SOLVED: To provide an abrasive layer analyzer designed to detect a part with macro unevenness of a polymer sheet and determine whether the polymer sheet complies with requirements.SOLUTION: The abrasive layer analyzer includes: a sequencer; a light source discharging a beam of light; a...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	JEFF TSAI, SWEE-TENG CHIN, MARK GAZZE, WILLIAM A HEESCHEN, JAMES DAVID TATE, SCOTT CHANG, FRANCIS V ACHOLLA, WANK ANDREW R, LEO H CHIANG
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	DRESSING OR CONDITIONING OF ABRADING SURFACES FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS GRINDING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING MEASURING PERFORMING OPERATIONS PHYSICS POLISHING TESTING TRANSPORTING
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