INSPECTION DEVICE

PROBLEM TO BE SOLVED: To provide an inspection device that can concurrently inspect a plurality of measuring objects, thereby reducing the time for inspection.SOLUTION: An inspection device 10 includes: a wavelength multiplexed light source 11 emitting a wavelength multiplexed light made of a plurality of lights with different wavelengths multiplexed; an optical attenuator 12 attenuating and outputting a wavelength multiplexed light; a demultiplexer 13 dividing the wavelength multiplexed light into a plurality of lights and outputting the lights to a plurality of measuring objects; a plurality of measuring units 15-1 to 15-n respectively connected to the measuring objects and measuring the output characteristics of the measuring objects; and a control terminal 16 receiving the measurement results from the measuring units 15-1 to 15-n.SELECTED DRAWING: Figure 1 【課題】複数の被測定物の検査を同時に行うことができ、検査にかかる時間を短縮できる検査装置を提供する。【解決手段】検査装置１０は、互いに波長の異なる複数の光を多重化した波長多重光を出射する波長多重光源１１と、波長多重光を減衰して出力する光減衰器１２と、波長多重光を複数の光に分波し、複数の被測定物へ出力する分波器１３と、複数の被測定物それぞれと接続され、被測定物の出力特性を測定する複数の測定器１５−１〜１５−ｎと、測定器１５−１〜１５−ｎからの測定結果を受信する制御端末１６と、を備える。【選択図】図１