FLAW DETECTION SYSTEM FOR DETECTING INTERNAL DEFECT IN FLAW DETECTION OBJECT, AND FLAW DETECTION METHOD

PROBLEM TO BE SOLVED: To enable a defect of even a moving flaw detection object to be detected, in a flaw detection system for detecting a defect such as a flaw existing in the flaw detection object or peeling thereof by measuring the surface temperature of the heated flaw detection object.SOLUTION:...

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Hauptverfasser: UTSUNOMIYA MAKOTO, HABUKA YOSHIRO, NISHITANI YUTAKA, FUKUI RYO
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:PROBLEM TO BE SOLVED: To enable a defect of even a moving flaw detection object to be detected, in a flaw detection system for detecting a defect such as a flaw existing in the flaw detection object or peeling thereof by measuring the surface temperature of the heated flaw detection object.SOLUTION: The flaw detection system includes: a halogen light 12 for continuously heating, at a predetermined heating position, a flaw detection object Z that relatively moves at a predetermined speed; an infrared camera 11 for acquiring the heat quantity of the heated flaw detection object in time series at a heat quantity acquisition position separate from the heating position by a predetermined distance on the downstream side of the heating position in the relative moving direction; a control unit 16; and a display unit 18 for displaying a defect existing in the flaw detection object on the basis of the time-series heat quantity at the heat quantity acquisition position.SELECTED DRAWING: Figure 1 【課題】加熱した探傷対象物の表面温度を測定することで、探傷対象物の内部に存在する傷や剥離等の欠陥を検出する探傷システムにおいて、移動する探傷対象物であっても欠陥を検出できるようにする。【解決手段】所定速度で相対移動する探傷対象物Zを、所定の加熱位置で連続的に加熱するハロゲンライト12と、加熱位置よりも相対移動方向の下流側に加熱位置から所定間隔空いた熱量取得位置における、加熱後の探傷対象物の熱量を時系列で取得する赤外線カメラ11,制御部16と、熱量取得位置における時系列の熱量に基づき、探傷対象物の内部に存在する欠陥を表示する表示部18と、を備えるようにした。【選択図】図1