SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND STORAGE MEDIUM

PROBLEM TO BE SOLVED: To provide a technique which allows for accurate detection of the fact that a process liquid existing on the surface of a substrate was replaced by a process liquid supplied later.SOLUTION: In a substrate processing apparatus 1 where a second process liquid is supplied to a sub...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: SUGANO ITARU
Format: Patent
Sprache:eng ; jpn
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a technique which allows for accurate detection of the fact that a process liquid existing on the surface of a substrate was replaced by a process liquid supplied later.SOLUTION: In a substrate processing apparatus 1 where a second process liquid is supplied to a substrate W, held horizontally in a substrate holding unit 31, after a first process liquid is supplied thereto, a process liquid distribution unit 53 is provided between the substrate W and a recovery cup 50 provided around the substrate W, and includes a distribution surface on which the process liquid flows. A concentration detector 604 irradiates the distribution surface with concentration detection light from a projection unit 61, and detects the concentration of at least one of the first process liquid and second process liquid, based on the results of a light reception unit 62 receiving the reflection light thereof.SELECTED DRAWING: Figure 3 【課題】基板の表面に存在する処理液が、後から供給された処理液に置換されたことを正確に検出することができる技術を提供する。【解決手段】基板保持部31に水平に保持された基板Wに対し第1処理液が供給された後、第2処理液が供給される基板処理装置1において、処理液通流部53は、基板Wと、この基板Wの周囲に設けられた回収カップ50との間に設けられ、処理液が流れる通流面を備える。濃度検出部604は、投光部61から前記通流面に濃度検出用の光を照射し、その反射光を受光部62にて受光した結果に基づいて、前記第1処理液または第2処理液の少なくとも一方の濃度を検出する。【選択図】図3