ATTACHMENT STRUCTURE OF ELECTRONIC DEVICE
PROBLEM TO BE SOLVED: To provide an attachment structure of an electronic device which inhibits deterioration of heat radiation performance.SOLUTION: A base substrate has an attached surface S4 to which an electronic device 100 is attached. The electronic device 100 has: a circuit board 10 where a p...
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide an attachment structure of an electronic device which inhibits deterioration of heat radiation performance.SOLUTION: A base substrate has an attached surface S4 to which an electronic device 100 is attached. The electronic device 100 has: a circuit board 10 where a power semiconductor device 20 is mounted on one surface S1; and a mold resin 50 sealing the power semiconductor device 20. An annular recessed part 53 enclosing the power semiconductor device 20 and a device facing part 54 facing the power semiconductor device 20 are formed in the mold resin 50. In the electronic device 100, a first area is formed between the device facing part 54 and the attached surface S4 and a second area is formed between the recessed part 53 and the attached surface S4 in a state where an entire periphery of an edge part of the mold resin 50 adheres to the base substrate 200. The electronic device 100 is attached to the base substrate 200 in a state where a heat radiation gel 300 is disposed in the first area and the second area.SELECTED DRAWING: Figure 2
【課題】放熱性が低下することを抑制できる電子装置の取り付け構造を提供すること。【解決手段】ベース基板は、電子装置100が取り付けられる被取付面S4と有している。電子装置100は、パワー半導体素子20が一面S1に実装された回路基板10と、パワー半導体素子20を封止しているモールド樹脂50とを有している。モールド樹脂50は、パワー半導体素子20を囲う環状の凹部53と、パワー半導体素子20に対向した素子対向部54とが形成されている。電子装置100は、モールド樹脂50の縁部全周がベース基板200と密着した状態で、素子対向部54と被取付面S4との間に第1領域が形成されると共に、凹部53と被取付面S4との間の第2領域とが形成される。そして、電子装置100は、第1領域と第2領域とに放熱ゲル300が配置された状態で、ベース基板200に取り付けられている。【選択図】図2 |
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