METHOD AND DEVICE FOR MEASURING THICKNESS OF FILM LAYER OF FLOWING STRIP

PROBLEM TO BE SOLVED: To propose means capable of generating density mapping of the thickness of a film layer of a strip, controlling coating film line densely, and measuring the thickness of the film layer of a flowing strip at sufficiently high speed and with accuracy so as to adjust operational i...

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Bibliographische Detailangaben
1. Verfasser:	PIERRE GAUJE
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL CHEMICAL SURFACE TREATMENT CHEMISTRY COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING MATERIAL WITH METALLIC MATERIAL COATING METALLIC MATERIAL DIFFUSION TREATMENT OF METALLIC MATERIAL INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS METALLURGY PERFORMING OPERATIONS PHYSICS PROCESSES FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TOSURFACES, IN GENERAL SPRAYING OR ATOMISING IN GENERAL SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION TESTING TRANSPORTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To propose means capable of generating density mapping of the thickness of a film layer of a strip, controlling coating film line densely, and measuring the thickness of the film layer of a flowing strip at sufficiently high speed and with accuracy so as to adjust operational irregularity of relatively high speed of process.SOLUTION: With an eddy current sensor, a number indicating the thickness of a film layer is measured, and the thickness of a film material layer of a flowing strip 1 is determined by the measured number and at least one calibration value. Measurement with the eddy current sensor includes measurement of complex impedance of a coil facing the flowing strip 1 at a low-excitation frequency and high-excitation frequency, and calculation of the number indicating the thickness of the film layer by using the complex impedance measurement.SELECTED DRAWING: Figure 1 【課題】条片の塗膜層の厚さの密度度マッピングを生成可能にし、且つ塗膜ラインの密な制御が可能であり、プロセスの比較的高速の動作不規則性を調整可能にする十分に高速で正確な、流れている条片の塗膜層の厚さを測定する手段を提案する。【解決手段】渦電流センサを用いて、塗膜層の厚さを表す数量が測定され、流れる条片１の塗膜材料層の厚さは、測定された数量及び少なくとも１つの較正値を用いて決められる。渦電流センサを用いて行われる測定は、低励起周波数及び高励起周波数で流れる条片１に面するコイルの複素インピーダンスの測定と、複素インピーダンス測定を用いた塗膜層の厚さを表す数量の計算とを含む。【選択図】図１