INSPECTION DEVICE

PROBLEM TO BE SOLVED: To provide an inspection device capable of easily inspecting an inspected object having an expansion part.SOLUTION: A second inspection mechanism comprises a second illumination device 90. The second illumination device 90 includes a light emission part 90b long in a longitudin...

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Bibliographische Detailangaben
Hauptverfasser: WATANABE SHINYA, NAKAYAMA TAKEHIKO, SHIGETA BUNGO, OZAWA TOMOHISA, TAKAHASHI IPPEI
Format: Patent
Sprache:eng ; jpn
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide an inspection device capable of easily inspecting an inspected object having an expansion part.SOLUTION: A second inspection mechanism comprises a second illumination device 90. The second illumination device 90 includes a light emission part 90b long in a longitudinal direction A of a cylindrical body 20 and irradiates the cylindrical body 20 with parallel light which spreads in the longitudinal direction A of the cylindrical body 20 and which are parallel in a width direction B of the cylindrical body 20. Therefore, even in the case of having inclination such as a bulge part 20b, illumination with brightness substantially equal to a main body part 20a can be performed. As for a defect in the bulge part 20b, light scatters at the same level as a defect of the main body part 20a, so that a defect detection of the bulge part 20b can also be performed at the same level as the main body part 20a.SELECTED DRAWING: Figure 15 【課題】膨らみ部を有する被検査物の検査が容易な検査装置を提供する。【解決手段】第2検査機構は、第2照明装置90を備えている。第2照明装置90は、円筒体20の長手方向Aに長い発光部90bを有し、円筒体20の長手方向Aについては拡散し、円筒体20の幅方向Bについては平行な平行光を、円筒体20へ向けて照射する。これにより、バルジ部20bのように傾斜を持っている場合であっても、本体部20aと実質同等の輝度で照明することができる。そして、バルジ部20bの欠陥についても本体部20aの欠陥と同程度に光が散乱するので、バルジ部20bにおいても本体部20aと同等の欠陥検出を行うことができる。【選択図】図15