INSPECTION DEVICE

PROBLEM TO BE SOLVED: To provide an inspection device capable of easily detecting even a small-sized defect part such as fine scratches.SOLUTION: An imaging range W1 of a first camera is set including a boundary area LD between a bright-field area L and a dark-field area D in an outer peripheral sur...

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Bibliographische Detailangaben
Hauptverfasser: WATANABE SHINYA, NAKAYAMA TAKEHIKO, SHIGETA BUNGO, OZAWA TOMOHISA, TAKAHASHI IPPEI
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide an inspection device capable of easily detecting even a small-sized defect part such as fine scratches.SOLUTION: An imaging range W1 of a first camera is set including a boundary area LD between a bright-field area L and a dark-field area D in an outer peripheral surface of a cylindrical body 20. A first image processing unit sets the boundary area LD as a defect inspection area and analyzes an image of this area to detect a defect part. The boundary area LD between the bright-field area L and the dark-field area D can be reproduced clearly even for the shape and range of a defect part and also for a small-sized defect part such as fine scratches. Thus, defect parts having various size, shape and range can be detected without fail by including the boundary area LD at least in the imaging range W1 of the first camera 82.SELECTED DRAWING: Figure 9 【課題】微細なキズなどサイズが小さい欠陥部位も容易に検出できる検査装置を提供する。【解決手段】第1カメラの撮影範囲W1は、円筒体20の外周面のうち、明視野領域Lと暗視野領域Dとの境界領域LDを含むように設定されている。そして、第1画像処理部は、この境界領域LDを欠陥検査領域と設定し、この領域の画像を解析し、欠陥部位を検出する。明視野領域Lと暗視野領域Dの境界領域LDは、欠陥部位の形状や範囲を明瞭に再現することができるとともに、欠陥部位の中でも微細なキズなどサイズが小さい欠陥部位に関しても明瞭に再現することが可能である。したがって、この境界領域LDを第1カメラ82の撮影範囲W1に少なくとも含めておくことで、様々なサイズ、形、範囲を持つ欠陥部位を漏れなく検出できる。【選択図】図9