CIRCUIT DEVICE HAVING THREE-DIMENSIONAL WIRING, METHOD FOR FORMING THREE-DIMENSIONAL WIRING, AND A COMPOSITION FOR METAL FILM FORMATION FOR THREE-DIMENSIONAL WIRING
PROBLEM TO BE SOLVED: To provide a circuit device having three-dimensional wiring with good conductivity, which makes possible to readily manufacture the three-dimensional wiring with a relatively high productivity at a relatively low manufacturing cost.SOLUTION: A silicon through wiring board 1 hav...
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide a circuit device having three-dimensional wiring with good conductivity, which makes possible to readily manufacture the three-dimensional wiring with a relatively high productivity at a relatively low manufacturing cost.SOLUTION: A silicon through wiring board 1 having three-dimensional wiring arranged so that an upper wiring 12a and a lower wiring 13a are electrically connected to each other by a contact plug 14a is manufactured. The contact plug CP includes a bottom part seed layer BS, a main seed layer MS, and a plug main body PB. The bottom part seed layer BS is formed by a conductor layer formed by vapor deposition. The main seed layer MS is formed by heating a coating film of a composition for metal film formation which includes at least one of a salt of a metal selected from Group X and Group XI of the periodic table and particles thereof.SELECTED DRAWING: Figure 1
【課題】導電性が良好な3次元配線を有し、当該3次元配線を比較的高い生産性の下に、かつ比較的低い製造コストの下に製造することが容易な3次元配線を有する回路装置を提供する。【解決手段】上側配線12aと下側配線13aとがコンタクトプラグ14aによって互いに電気的に接続されている3次元配線を有するシリコン貫通配線基板1を作製するにあたって、コンタクトプラグCPを底部シード層BSと主シード層MSとプラグ本体PBとで構成すると共に、底部シード層BSは気相蒸着法によって形成された導電体の層で形成し、主シード層MSは、周期表の第10族および第11族から選ばれる金属の塩および粒子の少なくとも一方を含有する金属膜形成用組成物の塗膜を加熱することで形成する。【選択図】図1 |
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