STATE INSPECTION RESULT ACQUISITION DEVICE AND STATE INSPECTION RESULT ACQUISITION METHOD

PROBLEM TO BE SOLVED: To acquire an inspection result on a state of an individual circuit in increased accuracy, on the basis of an actual measurement value.SOLUTION: When abnormal individual circuits DCU and normal individual circuits DCU are mixed among a plurality of individual circuits DCU in a...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	OGAWARA TAKAHIRO
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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