STATE INSPECTION RESULT ACQUISITION DEVICE AND STATE INSPECTION RESULT ACQUISITION METHOD

PROBLEM TO BE SOLVED: To acquire an inspection result on a state of an individual circuit in increased accuracy, on the basis of an actual measurement value.SOLUTION: When abnormal individual circuits DCU and normal individual circuits DCU are mixed among a plurality of individual circuits DCU in a...

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1. Verfasser: OGAWARA TAKAHIRO
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:PROBLEM TO BE SOLVED: To acquire an inspection result on a state of an individual circuit in increased accuracy, on the basis of an actual measurement value.SOLUTION: When abnormal individual circuits DCU and normal individual circuits DCU are mixed among a plurality of individual circuits DCU in a circuit network, the following steps are executed. In the step 86, a failure net list is created regarding the circuit network in which the abnormal individual circuit DCU is failed. In the step 87, by using the failure net list, a simulation value regarding the normal individual circuit DCU is acquired by simulation. In the step 88, simulation is performed for the normal individual circuit DCU by comparing a corresponding reference region with the above simulation value, and on the basis of an inspection result of the simulation, in the step 89, a state inspection result REm based on an actual measurement value is verified.SELECTED DRAWING: Figure 3 【課題】より高い精度で個別回路の状態についての検査結果を実測値に基づいて取得する。【解決手段】回路網における複数の個別回路DCUの中に異常個別回路DCUと正常個別回路DCUとが混在しているときには、ステップ86で異常個別回路DCUを故障させた回路網についての故障ネットリストを作成し、ステップ87でこの故障ネットリストを使用して正常個別回路DCUについてのシミュレーション値をシミュレーションによって取得し、ステップ88でこのシミュレーション値と対応する基準範囲とを比較して得られる正常個別回路DCUについてのシミュレーション上での検査結果に基づいて、ステップ89で実測値に基づく状態検査結果REmを検証する。【選択図】図3