SWITCH DEVICE
PROBLEM TO BE SOLVED: To shorten the response lag time at the time of turn-off, without worsening suppression of the in-rush current and the response lag time at the time of turn-off of a switch device.SOLUTION: A connection/interruption switching element Q51 is inserted in the way of a power supply...
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Zusammenfassung: | PROBLEM TO BE SOLVED: To shorten the response lag time at the time of turn-off, without worsening suppression of the in-rush current and the response lag time at the time of turn-off of a switch device.SOLUTION: A connection/interruption switching element Q51 is inserted in the way of a power supply line L51 connecting a high potential side input terminal T1p and a high potential side output terminal T2p. Between the source and gate of the connection/interruption switching element Q51, a capacitive element C51 for integration and a resistive element R51 for charge and discharge are connected in series. Between the gate of the connection/interruption switching element Q51 and a ground line L52, a resistive element R52 for current limitation and a switching element Q52 for driving are connected. Furthermore, between the positive electrode terminal of the capacitive element C51 for integration and the connection point of the switching element Q52 for driving and the resistive element R52 for current limitation, a resistive element R56 for rapid discharge is connected.SELECTED DRAWING: Figure 1
【課題】スイッチ装置について突入電流の抑制およびターンオン時の応答遅れ時間を悪化させることなく、ターンオフ時の応答遅れ時間の短縮化を進める。【解決手段】高電位側の入力端子T1pと高電位側の出力端子T2pとを繋ぐ電源供給ラインL51の途中に接続/遮断用のスイッチング素子Q51が挿入される。接続/遮断用のスイッチング素子Q51のソースとゲートとの間に積分用の容量素子C51および充放電用の抵抗素子R51が並列接続される。接続/遮断用のスイッチング素子Q51のゲートと接地ラインL52との間に電流制限用の抵抗素子R52と駆動用のスイッチング素子Q52が接続される。さらに、積分用の容量素子C51の正極端子と、駆動用のスイッチング素子Q52と電流制限用の抵抗素子R52との接続点との間に急速放電用の抵抗素子R56が接続される。【選択図】図1 |
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