MASS INSPECTION APPARATUS
PROBLEM TO BE SOLVED: To provide a new inspection apparatus capable of adjusting the article transportation speed and the set value of the inspection apparatus without stopping a manufacturing line.SOLUTION: A mass inspection apparatus includes: a measuring conveyor configured to measure mass of an...
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Format: | Patent |
Sprache: | eng ; jpn |
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide a new inspection apparatus capable of adjusting the article transportation speed and the set value of the inspection apparatus without stopping a manufacturing line.SOLUTION: A mass inspection apparatus includes: a measuring conveyor configured to measure mass of an article while conveying the article (product); determination means configured to compare the measurement results with a set value to determine whether mass of the measured article is correct or not; changing means configured to change the transportation speed and the set value of the article during operation; and control means configured to continue operation while reflecting the changed transportation speed and set value.
【課題】製造ラインを止めなくても、検査装置の物品搬送速度や設定値の調整ができる新たな検査装置を提供する。【解決手段】物品(製品)を搬送しながら該物品の質量を計量する計量コンベヤと、その計量結果と設定値とを比較して計量した前記物品の質量の良・不良を判定する判定手段と、運転中に前記物品の搬送速度や前記設定値を変更する変更手段と、変更された搬送速度や設定値を反映させて運転を続行させる制御手段とを備える。【選択図】図1 |
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