SEMICONDUCTOR DEVICE
PROBLEM TO BE SOLVED: To provide a semiconductor device which can reduce an inductance component included in internal wiring to achieve a sufficient surge voltage inhibiting effect.SOLUTION: A semiconductor device comprises: a P terminal wiring pattern 51 for a P terminal and an N terminal wiring pa...
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Format: | Patent |
Sprache: | eng ; jpn |
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide a semiconductor device which can reduce an inductance component included in internal wiring to achieve a sufficient surge voltage inhibiting effect.SOLUTION: A semiconductor device comprises: a P terminal wiring pattern 51 for a P terminal and an N terminal wiring pattern 52 for an N terminal; mounting parts P11-P13 formed on three allocation regions allocated on the P terminal wiring pattern 51 for a U-phase circuit part 5U, a V-phase circuit part 5V and a W-phase circuit part 5W allocated, respectively; and mounting parts P21-P23 formed on three allocation regions allocated on the N terminal wiring pattern 52 for the U-phase circuit part 5U, the V-phase circuit part 5V and the W-phase circuit part 5W, respectively. The mounting parts P11-P13 and P21-P23 have a snubber circuit mounting structure capable of attaching or detaching corresponding mounted terminals 81 and 82 of the snubber circuit 8.
【課題】内部配線に含まれるインダクタンス成分の低減を図り、十分なサージ電圧抑制効果を実現可能な半導体装置を得る。【解決手段】P端子用のP端子配線パターン51とN端子用のN端子配線パターン52とを形成し、装着部P11〜P13はP端子配線パターン51上にU相回路部5U、V相回路部5V及びW相回路部5W用に割り当てられた3つの割り当て領域上に形成され、装着部P21〜P23は、N端子配線パターン52上にU相回路部5U、V相回路部5V及びW相回路部5W用に割り当てられた3つの割り当て領域上に形成される。これら装着部P11〜P13及びP21〜P23は、対応するスナバ回路8の被装着端子81及び82を着脱可能なスナバ回路装着構造を有している。【選択図】図2 |
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