DEVICE AND SYSTEM

PROBLEM TO BE SOLVED: To detect abnormality of a filter accurately.SOLUTION: A filter 113 is provided at the intake position of a rack 110 for housing a first electronic device 111. A first measurement section 121 measures the temperature of the first electronic device 111. A second measurement sect...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SENBA TERUHIKO, SATO HIROYOSHI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	CALCULATING CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS PHYSICS PRINTED CIRCUITS
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