SEMICONDUCTOR DEVICE WITH PASSIVATION LAYER AND METHOD FOR PRODUCING THE SAME

PROBLEM TO BE SOLVED: To provide a semiconductor device with a mechanically and chemically robust passivation layer, and a method for producing the same.SOLUTION: A semiconductor device includes a semiconductor body 100 having a first surface, a contact electrode 2 on the first surface, and a passiv...

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Bibliographische Detailangaben
Hauptverfasser: JENS PETER KONRATH, RUPP ROLAND, ANDRE KABAKOW, CHRISTIAN HECHT
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a semiconductor device with a mechanically and chemically robust passivation layer, and a method for producing the same.SOLUTION: A semiconductor device includes a semiconductor body 100 having a first surface, a contact electrode 2 on the first surface, and a passivation layer 3 on the first surface 101 adjacent to the contact electrode 2 and partially overlapping the contact electrode 2. The passivation layer 3 comprises a layer stack with a first layer 31 comprising an oxide on the first surface and a second layer 32 comprising a nitride on the first layer. 【課題】機械的および化学的にロバストなパッシベーション層を有する半導体素子およびその生産方法を提供する。【解決手段】半導体素子は、第1の表面を有する半導体本体100と、第1の表面上の接触電極2と、接触電極2に隣接し、接触電極2と部分的に重なり合う第1の表面101上のパッシベーション層3とを含む。パッシベーション層3は、第1の表面上の酸化物を含む第1の層31と、第1の層上の窒化物を含む第2の層32とを有する積層体を含む。【選択図】図1